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简单介绍:
X射线分析应电子邻域高品质、高效、易操作的检测要求,Quadra™ 7旨在提供行业内上等的X射线检测方案,高功率时仍可保证行业*高的特征识别,10W特证识别可达到0.1μm,这将满足任何的研究、开发、失效分析及品质控制的要求。
详情介绍:
x射线剖析应电子器件邻域高质量、高效率、易实际操作的检测规定,Quadra™ 7致力于出示行业内上等的x射线检测计划方案,大功率时仍可确保行业*高的特点识别,10W特证识别可做到0.1μm,这将考虑一切的科学研究、开发设计、失效分析及品质控制的规定。 The Complete X-ray Inspection Solution

The QuadraTM 7 is designed to deliver unbelievable levels of inspection, speed and ease of use for the demanding electronics market; perfect for any research, development, failure analysis or quality control labs.

The QuadraTM 7 is designed to deliver unbelievable levels of inspection, speed and ease of use for the demanding electronics market; perfect for any research, development, failure analysis or quality control labs.


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